Hioki 3504-60 C Hi-Tester (120Hz and 1kHz) with GP-IB, Binning, Contact

Hioki 3504-60 C Hi-Tester (120Hz and 1kHz) with GP-IB, Binning, Contact

C HiTESTERs 3506, 3505, 3504 and 3504-10 measure the C value (electrostatic capacitance) of most types of non-electrolytic capacitors. Models 3506 and 3505 provide high accuracy even when measuring small-value capacitance, and are ideal for small-capacitance internationally-recognized standard measurements requiring 1 kHz, 100 kHz and 1 MHz measurement frequencies. Model 3504 can measure large-capacitance MLCC (multi-layer ceramic capacitors) at their rated voltage, so it is most suitable for 120 Hz and 1 kHz measurements of large-value, non-electrolytic capacitors. All of these C HiTESTERs provide measurements as fast as 2 ms, and comparator and Bin functions for easy integration into automated lines. As an economically priced dedicated tester for integration in automatic systems, Model 3504-10 is the same as the 3504 without the BIN function and GP-IB interface.

Enhanced repeat-measurement accuracy

The lowest capacitance range of Models 3506 and 3505 is 220 fF* (at 1 MHz), with greatly improved repeatability accuracy for very low-capacitance measurements. * 1 fF (femtofarad) = 10-15F

Enhanced absolute accuracy

A self-calibration function minimizes variations in measurement values due to changes in ambient temperature. In addition, the cable-length compensation function minimizes measurement errors when the measurement cable is extended from 1 to 2 meters (using 1.5D-2V cable)

Enhanced contact-checking function

Contact errors while measuring can be detected by the Chatter Detection function, Low-C Reject function, Current Detection Circuit Monitoring function and the Applied Voltage Value Monitoring function. Yield rates are improved by judging measurement-object contact errors as ERR instead of FAIL.