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Teledyne LeCroy T3AWG3252 – High Defi nition Dual Channel Arbitrary Waveform Generator, 250 MHz

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Arbitrary/Function Generator,2 Ch,250 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing

  • 2 Channels 250 MHz
  • Accurate and versatile waveforms generation
  • Exceptional signal fidelity for developing quality products with a reduced design cycle
  • Unmatched wide output voltage window enables generating challenging in amplitude large-signal waveforms
  • Unmatched deep memory depth allows to store and reproduce complex pseudo-random waveforms for long play time testing
  • Combining the 2 analog channels with 8 synchronized Digital Channels for debugging and validating digital design
  • Arbitrary Function Generator, Arbitrary Waveform Generation and Digital Pattern Generation functionalities combined into one instrument
  • 24 Vpp Output Voltage and ±12 V HW Baseline Offset for a total output voltage window ±24 V or 48 V (50 Ohm into High Impedance)
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Description

Teledyne LeCroy T3AWG3252 High Definition Dual Channel Arbitrary
Waveform Generator

 
 

LeCroy_T3AWG_Series_tn

16-bit vertical resolution

  • Max Sampling rate of 1.2 GS/s
  • Waveform memory up to 1 Gpoint @Ch
  • Multifunctional solution instrument (AFG/AWG/DPG)

A multi-functional generator with an innovative architecture

T3AWG3352-3252 are multi-functional generators that combines many functions in one instrument, including Arbitrary Function Generator, Arbitrary Waveform Generator and Digit al Pattern Generator. These three-different functionalities are leveraging on the HW flexibility adopting two different technologies. An improved Direct Digital Synthesis (DDS) based technology adopted when using the Function Generator (AFG) lets the user to change glitch free on-the-fly all the parameters preserving the waveform shape. All control and setting are always one touch away: swipe gesture to change the channel, the carrier selection and have access to the modulation parameters, swipe into the waveform gallery to import a signal at a glance and use the touch-friendly virtual numeric keyboard to change parameters values.
 
The variable clock, true-arbitrary technology adopted when using the Arbitrary Waveform / Digital Pattern Generator lets the user to create complex waveforms of analog and digital pattern, insert them is a sequence, apply loops, jumps and conditional branches. Digital output combined and synchronized with analog output signals represents an ideal tool to troubleshoot and validate digital design. The waveform memory length of 128 Mpoints (up to 1 Gpoints optional) on each channel combined with number of waveforms entries up to 16,384 and the waveform repeat count higher then 4 109 or infi nite make the T3AWG3252 and the T3AWG3352 the best-in-class waveform generators for the most demanding technical applications. This disruptive and innovative hardware architecture provides the possibility to generate unmatched performances, versatile functionality, outstanding usability, making the T3AWG3352-3252 the ideal generator for today’s and tomorrows test challenges.

 

AFG Operational Mode
Improved Direct Digital Synthesis (DDS) based technology
Fixed sampling clock
AWG Operational Mode
Variable Clock True-Arbitrary Technology
Variable Sampling Clock
Mixed Signal Generation: 2 Analog Channels and 8 Digital Channels
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Arbitrary Function Generation (AFG functionality)Arbitrary Waveform Generation (AWG functionality)Digital Pattern Generation (DPG functionality)

 

Exceptional Signal Fidelity with 16-bit Vertical Resolution

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4Vpp Sine Wave and 5 x 10 mVpp Square Wave Sequencing

details of your waveform making your testing highly efficient and increasing the confidence in your results as more stable and reliable.

Output Voltage Window ± 12 V (50 Ω into 50 Ω) or ± 24 V (50 Ω into High Impedance)

Output voltage swing is a compulsory requirement for key applications for the IC and Semiconductor Test or Defense marker segment. The T3AWG3252 and T3AWG3352 generators have unmatched outstanding voltage swing capability leveraging on two different combined features. The 12 Vpp (50 Ω into 50 Ω) amplitude range and the ±6 V (50 Ω into 50 Ω) hardware offset voltage. The following images show a 12 Vpp sinewave (50 Ω into 50 Ω) shifted from -12 V to 0 V to 0 V to +12 V using the hardware base voltage offset setting and a 24 Vpp pulse from 0 V to 24 V (50 Ω into high Impedance).

Highest signal accuracy and precise waveform details generation are key contributors for developing quality products with a reduced design time. Indeed, the pressure is to get products to market faster with a shortest design cycle and with the increase of the quality goals. The exceptional Signal Fidelity of the T3AWG3352 and T3AWG3252 with the 16-bit Vertical Resolution give the capability to emulate the thinnest

 

High Definition Stimulus-Response model:

Applying an HD Stimulus with the T3AWG generator to the DUT and analyzing the Response using an HD Oscilloscope Different measurements scenarios:

  1. Emulation of clean and “perfect signal”, so that uncontrolled and unknown distortions are not influencing the DUT response behavior.
  2. Emulation of “real-world signal” including distortions to test the DUT response behavior before any signal source is available. Playback of signals previously acquired using the oscilloscope and imported into the AWG.
  3. Emulation of extreme signal condition “stress test”, we can emulate diffi cult conditions and corner case signals that can be statistically infrequent to test the DUT response behavior.
  4. Emulation of noise or interference signal “noise and interference immunity”, so we can generate expected interference signal to add to expected signal and test the DUT response behavior
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High Definition Generator: Key Applications at a glance

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Today’s cars are including lots of highly sophisticated electronic control units (ECU) with very sensitive electronic components. The 16-bits vertical resolution combined with the 1.2 GS/s fast sampling rate make the High Definition T3AWG Arbitrary Generators indispensable tools for successfully and efficiency addressing the new testing challenges in automotive.
  • CAN, CAN-FD, LIN, Flexray, SENT emulation and troubleshooting
  • 100BASE-T1, 1000BASE-T1, BroadR-Reach emulation and immunity from interference signal and noise
  • EMI debugging, troubleshooting and testing
  • Electrical standards emulation up to 24 V
  • Power MOSFET circuitry in automotive electronics optimization and characterization
Radar test and electronic warfare require to create specific complex true-to-life signals. The spectral purity, the wide voltage swing and the long waveform play-time make the High Definition T3AWG Arbitrary Generators the ideal tools for the military research and development sector.
  • Frequency response, intermodulation distortion and noisefi gure measurements characterization of components, subsystems and systems
  • Phase Locked Loop (PLL) pull-in and hold range characterization
  • RF I/Q modulators emulation and characterization
  • RADAR base-band signals emulation to improve target resolution and detection and decrease false target return (noise immunity)
  • MIL-1553 , ARINC 429 and PRBS long-play time emulation
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Researches and Scientists require to emulate pulses adding amplitude and timing variation imperfections in an accurate, detailed and repeatable controlled manner. Physics, electronics, chemistry, mechanics and other disciplines can benefit from the user interface versatility combined with the fast edge generation, the excellent dynamic range and the unmatched accuracy of the High Definition T3 AWG generators.
  • Emulation of signal sources adding noise and known modulation distortion
  • Modulating and driving laser diode with detailed waveform generation
  • Generation/playback of real-world signals previously acquired using an High Definition Oscilloscope and imported into the High Definition T3 AWG generator.
  • Emulation of long PRBS sequences with the 8 digital output channels synchronous with analog waveforms
  • Generation of multi-level and multi-edge pulses long waveforms with the 1 GSample @Ch memory
Today’s IC, components, electronic circuits and sensors are required to be highly reliable extending the operating range in many variables. Stress test need to be performed to confirm the mathematical model used for predicting breaking points or safe usage limits. The output voltage resolution combined with large voltage swing and the mixed mode operation make the High Definition T3AWG the best tool for developing quality components with a reduced design time.
  • Clock generation for component overclock behavior and operating range limit and stress test
  • Power Integrity testing of electric and electronic components for use in motor vehicles at low voltage
  • Sensors signals generation: emulation of ideal signals or generation of real world signals after acquisition with an High Definition Oscilloscope .
  • MOSFET gate drive amplitude signal emulation for MOSFET characterization and optimization
  • Power up sequences of IC using the low impedance feature (5 Ω output impedance).

Generators / Counters/Function Generator Template

Channels2 
Frequency Maximum250 MHz
Frequency Minimum1 uHz (0.000001 Hz)
FunctionsBurst, Noise, Pulse, Ramp, Sine, Square, Sweep
Max Amplitude Vpp @ 50 ohms12 V
ArbitraryYes
Sample Rate1.0 GS/S (1000 MSa/S)
Screen TypeLCD
Color ScreenNo
TriggeringYes
Modulation TypesAM, FM, FSK, PSK, PWM
Memory8 GB (8388608 kB)
Direct Digital Synthesis (DDS)No
PC BasedNo

Product General Attributes

Warranty1 YEARS
Warranty DetailsStandard warranty is 1 year, Extendable warranty 3 years
Interfaces I/OHDMI, VGA or SVGA Out
Product Weight6.5 KILOS (14.33 LBS)
Product Height143 MM (5.63 IN)
Product Width362 MM (14.25 IN)
Country of OriginItaly

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Weight6.5 lbs
Dimensions362 × 143 in
Teledyne LeCroy T3AWG3252 &#82...

$22,984.50

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