Fotric 618C-L29 – R&D Station with 30 Degree Lens and Test Bench (640×480)

• IR Resolution: 640 x 480
• Includes 30 degrees Lens and Test Bench
• Thermal sensitivity (NETD): ＜ 0.03℃ @30℃ , 30mk
• -20 ~ 650°C Temperature Range
• State-of-the-art imaging algorithm significantly reduces noise and boosts image clarity

The FOTRIC 600 R&D Station offers powerful, cutting-edge insights for your circuit boards, chips, and electronic equipment. It’s designed to detect problems before they occur.

The thermal imaging camera can be equipped with a 30° standard lens for a comprehensive overview, or with optional 20μm and 50μm macro lenses to obtain temperature distribution and detailed data of microstructures such as chips.

The thermal imaging camera is equipped with a dedicated R&D test platform, allowing researchers to observe and analyze in a flexible, fine and stable manner.

FOTRIC 600 R&D’s excellent hardware configuration, combined with extraordinary imaging algorithms, results in superior product performance.

• The 640*480 pixel infrared detector provides a thermal map with over 300,000 temperature points as a data matrix
• State-of-the-art imaging algorithm significantly reduces noise and boosts image clarity
• Thermal sensitivity of 0.03℃, more sensitive to temperature change and makes more accurate temperature measurement
• High EMC compatibility, effectively prevents electromagnetic interference and electrostatic breakdown

FOTRIC AnalyzIR is a professional thermal analysis software that matches the FOTRIC 600 R&D Thermal Camera. The software allows the user to view temperature changes, overall distribution and other information, and to adjust the camera configuration.

The FOTRIC 600 R&D, which is characterized by a great thermal sensitivity of up to 30 mK and macro lenses, specializes in microscopic world exploration. It offers engineers and researchers a streamlined solution to capture the thermal field of composite materials and electronics for defect detection. By capturing heat anomalies, it can quickly spot the faults of PCBs (Printed Circuit Boards), semiconductor wafers, and LED screens upon closer inspection.