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Hioki 3506-10 C Hi-Tester (1kHz and 1MHz) – Low Noise

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C Hi-Tester (1kHz and 1MHz) – Low Noise

  • High-speed analog test time of 0.6 ms (at 1 MHz)
  • Improved noise resistance and enhanced repeatability in measurement precision even for production lines
  • 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
  • BIN function, for easy component screening
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Description

Hioki 3506-10 C Hi-Tester (1kHz and 1MHz) – Low Noise

  • High-speed analog test time of 0.6 ms (at 1 MHz)
  • Improved noise resistance and enhanced repeatability in measurement precision even for production lines
  • 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
  • BIN function, for easy component screening

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. 3506-10 is a dual-band capacitance meter designed to be integrated with automatic taping machines and sorters for the production of MLCC (multi-layer ceramic capacitors).

Faster Measurement and Improved Repeatability

Compared to the previous model (3506), 3506-10 delivers higher measurement speeds in FAST mode and improvement by a factor of approximately 7 in repeatability for measurement of minuscule capacitance values in high-noise environments. These characteristics make the instrument ideal for embedded measurement in taping machines, sorters, and other automatic systems.

LCR Meters / Impedance Measurement Products /Capacitance Testers Template

TypeBenchtop

Product General Attributes

Unique Features1kHz, 100kHz
Interfaces I/O GPIB, Other, RS-232
Product Weight4.8 KILOS (10.58 LBS)
Product Height100 MM (3.94 IN)
Product Length260 MM (10.24 IN)
Product Width298 MM (11.73 IN)
ECCN Number3A992
Power Supply Voltage120V 50/60 Hz
Country of OriginJapan

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Weight4.8 lbs
Dimensions260 × 298 × 100 in
Hioki 3506-10 C Hi-Tester (1kH...

$5,929.00

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