Keithley 2470 – Graphical SMU Source Meter (1100V, 1A, 20W)

Keithley 2470 – Graphical SMU Source Meter (1100V, 1A, 20W)

The 2470 High Voltage SourceMeter^® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent^® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 1100 V and 10 fA capability, the 2470 is optimized for characterizing and testing high voltage, low leakage devices, materials, and modules, such as silicon carbide (SiC), gallium nitride (GaN), power MOSFETs, transient suppression devices, circuit protection devices, power modules, batteries, and much more.

These new capabilities, combined with Keithley’s decades of expertise in developing high precision, high-accuracy SMU instruments, make the 2470 a “go-to instrument” for high-voltage source and low-current measurement applications in the lab and in the test rack.

2470 main home screen.

2470 icon-based menu.

All-in-One SMU Instrument

The 2470, Keithley’s fourth generation of SourceMeter SMUs, leverages the proven capabilities of the original 2410 High Voltage SourceMeter SMU Instrument. SMU instruments offer a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current measurements. This all-in-one instrument has the capabilities of a:

Ease of Use Beyond the Touchscreen

In addition to its five-inch color touchscreen, the 2470 front panel offers a variety of features that enhance its speed, user-friendliness, and learnability, including a USB 2.0 memory I/O port, a HELP key, a rotary navigation/control knob, a front/rear input terminal selector button, and banana jacks for basic bench applications. The USB 2.0 memory port simplifies storing test results and instrument configurations, uploading test scripts into the instrument, and installing system upgrades. All front-panel buttons are backlit to enhance visibility in low-light environments.

Comprehensive Built-in Connectivity

Rear panel access to rear-input connectors, remote control interfaces (GPIB, USB 2.0, and LXI/Ethernet), a D-sub 9-pin digital I/O port (for internal/external trigger signals and handler control), instrument interlock connector, and TSP-Link^® connectors make it simple to configure multiple instrument test solutions and eliminate the need to invest in additional adapter accessories.

Convert Raw Data to Information

A full graphical plotting window converts raw data and displays it immediately as useful information, such as semiconductor I-V curves and waveforms. Using the 2470’s Sheet view, test data can also be displayed in tabular form. The instrument supports exporting data to a spreadsheet for further analysis, dramatically improving productivity for research, benchtop testing, device qualification, and debugging.

TriggerFlow^® Building Blocks for Instrument Control and Execution

The 2470 incorporates Keithley’s TriggerFlow triggering system, which provides user control of instrument execution. TriggerFlow diagrams are created in much the same way that flow charts are developed, using four building blocks:

Parallel Test Capability

The TSP technology in the 2470 supports testing multiple devices in parallel to meet the needs of device research, advanced semiconductor lab applications, and even high throughput production test. This parallel testing capability allows each instrument in the system to run its own complete test sequence, creating a fully multi-threaded test environment. The number of tests that can be run in parallel on a graphical SourceMeter can be as high as the number of instruments in the system.

Characterize transistors with multiple SMU instruments on wafer or packaged transistors

The 2470 is the ideal addition to your development bench for designing today’s high power devices and components.