Description
Keithley 2635B – Single-channel System SourceMeter SMU Instrument (0.1 fA, 10 A Pulse)
- Channels: 1
- Power: 200 W
- Max Current Source/Measure Range: 10A
- Max Voltage Source/Measure Range: 200V
- Measurement Resolution (Current / Voltage): 0.1fA / 100nV
The 2635B System SourceMeter SMU Instruments are the industry’s leading current/voltage source and measure solutions, and are built from Keithley’s third generation SMU technology. The 2635B offers single- and dual-channel models that combine the capabilities of a precision power supply, true current source, 6½-digit DMM, arbitrary waveform generator, pulse generator, and electronic load – all into one tightly integrated instrument.
The result is a powerful solution that significantly boosts productivity in applications ranging from bench-top I-V characterization through highly automated production test. Built-in web browser based software enables I-V testing through any computer from anywhere in the world. Or, use your Android smart device to perform plug & play I-V testing with fingertip control with the Keithley IVy application. For automated system applications, the 2635B Test Script Processor (TSP®) runs complete test programs from inside the instrument for industry-best throughput.
In larger, multi-channel applications, Keithley’s TSP-Link® Technology works together with TSP Technology to enable high-speed, SMU-per-pin parallel testing. Because 2635B SourceMeter SMU Instruments have fully isolated channels that do not require a mainframe, they can be easily reconfigured and re-deployed as your test applications evolve.
KickStart Start-up Software lets users be ready to make measurements in minutes.
Perform I-V Characterization with KickStart Instrument Control Start-up Software
KickStart Instrument Control/Start-up Software enables users to start making measurements in minutes without programming. In most cases, users merely need to make some quick measurements, graph the data, and store the data to disk for later analysis in software environments such as Excel. KickStart offers:
- Configure and control up to four SMU instruments for DC or Pulsed I-V test in either the same app, same project, or a combination of the two.
- Create tests by mixing any of these SMU instruments: 2400 Graphical Series, 2400 Standard Series (DC only), 2635B Series, 2651A, 2657A, and 6430 SourceMeter® SMU (DC only) instruments.
- Differentiate SMU instrument channels and their measurement data using labels that are relevant to your device or module.
- Native X-Y graphing, panning, and zooming; screenshot capturing of graphs.
- Spreadsheet/tabular viewing of data; export data for further analysis.
- Annotating of tests; save test setups.
- GPIB, USB 2.0, Ethernet compliance.
SMU-Per-Pin Parallel Testing using TSP and TSP-Link improves test throughput and lowers the cost of test.
SMU-Per-Pin Parallel Testing with TSP-Link Technology
TSP-Link is a channel expansion bus that enables multiple 2635B to be inter-connected and function as a single, tightly-synchronized, multi-channel system. The 2635B TSP-Link Technology works together with its TSP technology to enable high-speed, SMU-per-pin parallel testing. Unlike other high-speed solutions such as large ATE systems, the 2635B achieves parallel test performance without the cost or burden of a mainframe. The TSP-Link based system also enables superior flexibility, allowing for quick and easy system re-configuration as test requirements change.
Unmatched Throughput for Automated Test with TSP Technology
For test applications that demand the highest levels of automation and throughput, the 2635B TSP technology delivers industry-best performance. TSP technology goes far beyond traditional test command sequencers – it fully embeds then executes complete test programs from within the SMU instrument itself. This virtually eliminates all the time-consuming bus communications to and from the PC controller, and thus dramatically improves overall test times.
TSP technology executes complete test programs from the 2635B non-volatile memory.
Third-generation SMU Instrument
Design Ensures Faster Test Times Based on the proven architecture of earlier 2635B instruments, the 2635B SMU instrument design enhances test speed in several ways. For example, while earlier designs used a parallel current ranging topology, the 2635B uses a patented series ranging topology, which provides faster and smoother range changes and outputs that settle more quickly.
The 2635B SMU instrument design supports two modes of operation for use with a variety of loads. In normal mode, the SMU instrument provides high bandwidth performance for maximum throughput. In high capacitance (high-C) mode, the SMU instrument uses a slower bandwidth to provide robust performance with higher capacitive loads.
When you need to acquire data on a packaged part quickly, the wizard-based user interface of ACS Basic Edition makes it easy to find and run the test you want, like this common FET curve trace test.
Simplify Semiconductor Component Test, Verification, and Analysis
The optional ACS Basic Edition software maximizes the productivity of customers who perform packaged part characterization during development, quality verification, or failure analysis. Key features include:
- Rich set of easy-to-access test libraries
- Script editor for fast customization of existing tests
- Data tool for comparing results quickly
- Formulator tool that analyzes captured curves and provides a wide range of math functions
Complete Automated System Solutions
Keithley’s S500 Integrated Test Systems are highly configurable, instrument-based systems for semiconductor characterization at the device, wafer, or cassette level. Built on our proven 2635B System SourceMeter SMU instruments, our S500 Integrated Test Systems provide innovative measurement features and system flexibility, scalable to your needs. The unique measurement capability, combined with the powerful and flexible Automated Characterization Suite (ACS) software, provides a comprehensive range of applications and features not offered on other comparable systems on the market.
In the first and third quadrants, 2635B SMU instruments operate as a source, delivering power to a load. In the second and fourth quadrants, they operate as a sink, dissipating power internally.
Switch and Semiconductor Test Systems/Source Measure Unit / SMU Template | |
|---|---|
| Number of Quadrants | Four |
| Number of Channels (SMU) | One |
| Max Current Source/Measure Range (SMU) | 10 A |
| Max Voltage Source/Measure Range | 200 V |
| Maximum Output Power | 200 Watts |
Product General Attributes | |
| Warranty | 1 YEARS |
| Interfaces I/O | GPIB, LAN / Ethernet, LXI, RS-232, USB |
| Power Supply Voltage | 120V 50/60 Hz |
| Country of Origin | China |
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