Com-Power CDN-M425 – CDN-Four lines, 25 Amp, 150 kHz to 80 MHz

• Current Rating: up to 25 Amps
• Individual Calibration
• Two Year Warranty
• Meets EN 61000-4-6 requirements

The M series powerline Coupling / Decoupling Networks (CDN) are for testing from 150 kHz – 80 MHz according to the EN 61000-4-6 standard for immunity to conducted disturbance induced by radio frequency fields. The standard M series CDNs are available with 25 amperes current rating. The coupling network delivers injected common mode current disturbance signals through the power line conductors to the equipment under test (EUT). The decoupling networks are used to ensure that the disturbing signals injected on the powerline of the EUT by the coupling networks do not interfere with any of the auxiliary equipment connected to the EUT. Each CDN contains integrated direct capacitive coupling along with a high impedance choke for inductive decoupling. All CDNs are individually calibrated to meet the impedance requirement of EN 61000-4-6. However, test level calibration must be performed on site to determine the minimum required test signal needed to achieve the required voltage levels specified by EN 61000-4-6. The appropriate calibration accessories for conducting the test is available from Com-Power.

Application

During the test, the CDN is connected to the powerline cables between the equipment under test (EUT) and auxiliary equipment (AE). The number of conductors in the cable will determine which CDN to use for the test. The M125 CDN is used to couple common mode and modulated signals onto single power line systems. This CDN is ideal for electronic systems that uses the chassis as the DC return. The M225 CDN is for systems with two wire power conductor cables without an earth terminals and the M325 is for single phase two line cables with the an earth ground conductor. The M425 is used for three phase systems. The M525 CDN is used for three phase systems with neutral and protected earth ground conductors. All CDNs are also fitted with safety sockets for connecting the devices under test.