Siglent SRF5030T – Near Field Probe Set

Siglent SRF5030T – Near Field Probe Set

The Siglent SRF5030T near field probe set are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation and serve to locate and identify potential sources of interference within the building blocks of electronic assemblies.

The probes act similar to wide bandwidth antennas, picking up radiated emissions from components, PCB traces, housing openings or gaps, and from any other parts emitting RF. These are usually connected to a spectrum analyzer. Scanning the probe over the surface of a PCB assembly or housing quickly identifies locations which are emitting electromagnetic radiation. By changing to a smaller size probe, the origin of the emissions can be further narrowed down.

Additional applications are RF immunity tests by feeding an RF signal into the probe and radiating it into the potentially susceptible circuit sections. Furthermore, the probes can be used in the field of repair or debugging to track down issues in RF signal chains by contactless measurement of RF signal levels. An additional application is non-invasive measurement of RF building blocks, such as modulators or oscillators. Frequency, phase noise and spectral components can be measured in conjunction with a low noise pre-amplifier.